Week 1: Brief overview of analytical atomic spectroscopy: history, physical principles, electromagnetic radiation and its interaction with matter, atomic spectra Week 2: Atomic absorption spectrometry (AAS): basic principles, techniques, instrumentation (sample introduction systems, radiation sources, atomizers, detectors, signal processing, background correction - D2, Zeeman and self-reversal or HR-CS-AAS), analytical characteristics and applications Week 3: Matrix effects in AAS: non-selective absorption of radiation, causes of spectral and non-spectral interferences and possibilities for its overcoming (instrumental BC, HR-CS-AAS, chemical modification, matrix separation, etc.) Week 4: Vapor generation: basic principles, Hydride generation: reduction reactions, hydride generator system, collection, atomization, light sources, automatic systems, FIA, sample preparation, matrix interferences, Cold vapor technique: analytical applications, instrumentation, etc., Direct mercury analysis: thermal decomposition, catalytic conversion, amalgamation, detection, etc. Week 5: Optical emission spectrometry (OES): general principles, optical systems, emission sources (arcs, high-voltage sparks, glow discharges, lasers and flames), the applications of each type of emission source, analytical characteristics Week 6: Inductively coupled plasma optical emission spectrometry (ICP-OES): theory of ICP-OES, instrumentation (sample introduction, production of emission, collection and detection of emission, wavelength dispersive devices, Echelle grating based instruments), method development strategy, optimization of parameters, interferences and its correction, merits, demerits, and applications Week 7: Atomic fluorescence spectrometry (AFS): principle of the method, types of atomic fluorescence, instrumentation (radiation sources, atomizers, detection systems, sample introduction, portable AFS), analytical characteristics, interference in AFS, analytical applications. Week 8: X-ray spectrometry: principle and characteristics of X-ray radiation, establishment of primary and fluorescent X-ray radiation, series of lines and their symbolism, non-radiative marches in the atom (secondary and Auger electrons), applications, advantages and limitations Week 9: X-ray fluorescence (XRF): wave dispersive spectrometers for simultaneous and sequential analysis, and their analytical properties, energy dispersive application of XRF spectrometers, components for XRF (X-ray generating equipment, collimator, analyzer crystal, monochromators, detectors), interference and its correction, applications Week 10: Inductively coupled plasma mass spectrometry (ICP-MS): brief history, overview of applications, theory of operation, description of the functional parts of instruments (torches, sample introduction systems, the vacuum and interface systems, mass analyzers (magnetic sector, single and double focusing, quadrupole, time-of-flight), detectors), etc. Week 11: Matrix effects in ICP-MS: spectroscopic interferences (isobaric elements, double charged interference, polyatomics), non-spectral effects (sample introduction, plasma and space-charge effects, instrument drift), and its reduction (mathematical corrections, CRC, matrix separation, tandem MS, etc.) Week 12: Sample preparation for AS: trends in generally used sample preparation procedures, general guidance for sample preparation, apparatus and accessories, lowering health and safety risks, optimization of procedure (design of experiments) Week 13: Speciation analysis: principal aims of speciation analysis, sample preparation for element speciation and fractionation, methods applied for identification and determination of particular chemical form of elements: parameters of hyphenated instrumentation for speciation aims, practical applications Week 14: Metrological aspects of quantitative analysis, requirements for analytical method validation, comparisons of the atomic spectrometric techniques
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