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Lecturer(s)
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Koudelka Ladislav, prof. Ing. DrSc.
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Vlček Miroslav, prof. Ing. CSc.
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Course content
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UV/VIS spectroscopy, AAS. IR and Raman spectroscopy. NMR, EPR spectroscopy. X-ray diffraction, EXAFS, Mössbauer spectroscopy. Thermal analysis - TG, DTA, DSC. Optical and electron microscopy. Auger spectroscopy, diffraction of electrons, mass spectroscopy. Rutheford back scattering, SIMS. Photoelectron spectroscopy - UPS, ESCA. Mikroscopy with electromechanical probe - AFM, STM, photoacustic microscopy. Methods of determination of basic parameters of thin films. Metods characterization of powder materials - morphology a particles size distribution. Picture analysis.
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Learning activities and teaching methods
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Monologic (reading, lecture, briefing)
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Learning outcomes
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Anotace: Students gain knowledge about wide spectrum of methods exploited in characterization of different materials and their properties. Methods applied for studies of bulk samples are studied together with surface analysis methods and methods specific for studies of powders. Cíl: The aim of this subject is to teach students to orientate themselves in modern methods exploited for materials characterization. Students will master principles of different methods which can be found in standard practice as well principles of most modern techniques exploited presently in top laboratories. Kompetence: Student is able at the end of this course to orientate in contemporary methods exploited for characterization of materials and their properties. He is competent to make decision which technique is suitable for study of specific samples and their properties.
Student is able at the end of this course to orientate in contemporary methods exploited for characterization of materials and their properties. He is competent to make decision which technique is suitable for study of specific samples and their properties.
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Prerequisites
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unspecified
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Assessment methods and criteria
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Written examination
Student writes summary test at the end of semester which results in classified credit. After that student passes oral exam during which examiners evaluate degree of assumption of the different characterization methods.
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Recommended literature
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Chapman. Materials Science on CD-ROM. An interactive learning tool for students. ISBN . 0 412 83660 2.
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Lindon C. Encyclopedia of Spectroscopy&Spectrometry. Academic Press, 2000. ISBN 1234.
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Vickerman, John C. Surface analysis : the principal techniques. Chichester: John Wiley & Sons, 1997. ISBN 0-471-97292-4.
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