Course: Analytical Methods for the Study of Thin Films

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Course title Analytical Methods for the Study of Thin Films
Course code KPF/C765
Organizational form of instruction Lecture + Seminary
Level of course Master
Year of study not specified
Semester Summer
Number of ECTS credits 5
Language of instruction Czech
Status of course Compulsory
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
Lecturer(s)
  • Němec Petr, prof. Ing. Ph.D.
  • Bouška Marek, doc. Ing. Ph.D.
Course content
UV-VIS spectroscopy. Optical absorption spectra of organic and inorganic compounds. Spectrophotometers - construction and procedures of spectra measurements. Emission spectroscopy (fluorescence and phosphorescence). Excitation energy transfer. Instruments construction and procedures of measurements. Optical methods of thin films characterization: optical transmittance and reflectivity, spectroscopic ellipsometry. Profilometry. Fourier transformation, its basic description and application in infrared spectroscopy. Infrared spectroscopy - principles, spectrophotometers, applications. Raman spectroscopy. Basic principles. Experimental techniques of Raman spectroscopy. Theory of nuclear magnetic resonance. Spin behavior in a magnetic field, resonance, nuclear shielding, chemical shift, relaxation. NMR spectrometers and measurements methods. Applications of NMR. Optothermal experimental methods. Photoacoustics and photoacoustic spectroscopy and microscopy. Applications possibilities to study of thin ink layers. Electron paramagnetic (spin) resonance. Origin of EPR signal. EPR spectral parameters. EPR spectrometers and applications of EPR for the study of materials properties. X-ray diffraction. The structure of materials, lattice, crystallographic system and Bravais cells. The origin of X-rays, its monochromatization and detection. Bragg equation. Mechanical properties. Elastic and plastic deformation. Measurement and evaluation of materials hardness. Strength, yield strength, fatigue strength. Fracture mechanics. Optical and electron microscopy. Experimental methods and applications. Analysis of chemical composition by EDX. Atomic force microscopy (AFM) - principles and applications. Thermoanalytical techniques (DSC, DTA, thermal gravimetry). Principles of the methods, instruments. Determination of chemical composition by elemental analysis. Mass spectrometry. Principles of the method, basic terms. Mass spectrum. Ionization techniques. Mass analyzers. Applications of mass spectrometry.

Learning activities and teaching methods
Monologic (reading, lecture, briefing), Skills training
  • Contact teaching - 39 hours per semester
  • Preparation for an exam - 60 hours per semester
  • Home preparation for classes - 13 hours per semester
  • Preparation for a partial test - 30 hours per semester
Learning outcomes
The student will acquire deeper information about principles, experimental and theoretical possibilities of applications of selected analytical methods suitable for the study of thin films.
The student will get overview of modern experimental analytical methods useful in the study of thin films, including thin films of polymeric materials, and will be able to understand and interpret experimental results acquired by these methods. Acquired knowledge can be utilized for diploma thesis processing.
Prerequisites
Good knowledge of the physics and macromolecular chemistry at the university level is required. Student should be able to understand the physical principles of experimental analytical methods for the study of properties of thin films to exploit them in his/her research work, for example in the frame of diploma work project.

Assessment methods and criteria
Oral examination, Written examination

The exam is written and oral. During semester, the knowledge is checked via two tests. Their results are taken into account for the overall evaluation.
Recommended literature
  • Campbell D., Pethrick R.A., White J.R. Polymer Characterization: Physical Techniques. 2000.
  • Leng Y. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. 2013. ISBN 978-3-527-33463-6.
  • Pavia D.L. Introduction to Spectroscopy. 2009.
  • Vondráček P. a kol. Metody studia a charakterizace struktury polymerů. Praha, 1991. ISBN 80-7080-087-9.


Study plans that include the course
Faculty Study plan (Version) Category of Branch/Specialization Recommended year of study Recommended semester