| Course title | Atomic Spectroscopy |
|---|---|
| Course code | UECHI/C149 |
| Organizational form of instruction | Lecture |
| Level of course | Master |
| Year of study | not specified |
| Semester | Winter |
| Number of ECTS credits | 3 |
| Language of instruction | Czech |
| Status of course | Compulsory |
| Form of instruction | Face-to-face |
| Work placements | This is not an internship |
| Recommended optional programme components | None |
| Lecturer(s) |
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| Course content |
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Atomic spectroscopy - introduction and basic theory, instrumentation, line sources, atomizers, dispersion devices, detectors, signal processing and modulation, specific and background absorption, background correction techniques (sequential and simultaneous, with continuum source, Smith-Hieftje and Zeeman background correction). Matrix effects - interferences. Flame atomization, Electrothermal atomization. Hydride technique and cold vapor technique. Thermo oxidative determination of mercury. Optical emission spectroscopy (OES), basic scheme of OES, generation of emission spectra - different sources, monochromators and polychromators, sequential and simultaneous analysis, detectors. ICP OES - Optical Emission Spectrometry with Inductively Coupled Plasma, basic definition of plasma, generation of ICP, instrumentation, interpretation of spectra and signal processing, interferences in ICP OES. Optical Atomic Fluorescence Spectroscopy. Basic principles and instrumentation. X-Ray spectroscopy. Interaction with high energy particles and photons, primary and secondary excitation, x-ray radiation, x-ray spectrum, line marking, comparison of primary and secondary excitation, review of X-ray methods. Rentgefluorescence spectrometry: basic principles, wavelength dispersive instruments, energy-dispersive instruments, quantitative analysis, influence of chemical composition on the signal, applications, sample preparation, instrumentation, TRXRF (total reflexion rentgenfluorecence spectrometry). PIXE: basic principles, interpretation of spektra Local X-Ray analysis. SEM microanalysis, u-XRF: basic principles, imaging modes Inorganic mass spektrometry: ICP-MS - basic principles, ICP - ion source, mass analyzers, resolution, instrumentation, interference, other inorganic mass spektrometry techniques: HR-ICP-MS, TOF-MS.
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| Learning activities and teaching methods |
| Monologic (reading, lecture, briefing) |
| Learning outcomes |
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The aim of the subject is to build a general image of novel methods of inorganic elemental analysis. The lectures give general review of all important methods of atomic optical spectroscopy, X-Ray spectroscopy and inorganic mass spectrometry.
After graduation of the subject, students will have systematic knowledge on inorganic elemental spectroscopy. |
| Prerequisites |
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Basic knowledge of instrumental analysis in the scope of bachelor study of technical chemistry.
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| Assessment methods and criteria |
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Oral examination
The final exam has only oral part. |
| Recommended literature |
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| Study plans that include the course |
| Faculty | Study plan (Version) | Category of Branch/Specialization | Recommended semester | |
|---|---|---|---|---|
| Faculty: Faculty of Chemical Technology | Study plan (Version): Environment Protection (2016) | Category: Ecology and environmental protection | 2 | Recommended year of study:2, Recommended semester: Winter |
| Faculty: Faculty of Chemical Technology | Study plan (Version): Environment Protection (2013) | Category: Ecology and environmental protection | 2 | Recommended year of study:2, Recommended semester: Winter |
| Faculty: Faculty of Chemical Technology | Study plan (Version): Environment Protection (2015) | Category: Ecology and environmental protection | 2 | Recommended year of study:2, Recommended semester: Winter |