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Course info
KPF / C765
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Course description
Department/Unit / Abbreviation
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KPF
/
C765
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Academic Year
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2023/2024
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Academic Year
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2023/2024
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Title
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Analytical Methods for the Study of Thin
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Form of course completion
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Examination
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Form of course completion
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Examination
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Long Title
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Analytical Methods for the Study of Thin Films
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Accredited / Credits
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Yes,
5
Cred.
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Type of completion
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Combined
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Type of completion
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Combined
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Time requirements
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Lecture
2
[HRS/WEEK]
Seminar
1
[HRS/WEEK]
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Course credit prior to examination
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No
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Course credit prior to examination
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No
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Automatic acceptance of credit before examination
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No
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Included in study average
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YES
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Language of instruction
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Czech
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Occ/max
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|
|
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Automatic acceptance of credit before examination
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No
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Summer semester
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7 / -
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0 / -
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0 / -
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Included in study average
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YES
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Winter semester
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0 / -
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0 / -
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0 / -
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Repeated registration
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NO
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Repeated registration
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NO
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Timetable
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Yes
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Semester taught
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Summer semester
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Semester taught
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Summer semester
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Minimum (B + C) students
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not determined
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Optional course |
Yes
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Optional course
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Yes
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Language of instruction
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Czech
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Internship duration
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0
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No. of hours of on-premise lessons |
0
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Evaluation scale |
A|B|C|D|E|F |
Periodicity |
každý rok
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Periodicita upřesnění |
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Fundamental theoretical course |
Yes
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Fundamental course |
No
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Fundamental theoretical course |
Yes
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Evaluation scale |
A|B|C|D|E|F |
Substituted course
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None
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Preclusive courses
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N/A
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Prerequisite courses
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N/A
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Informally recommended courses
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N/A
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Courses depending on this Course
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N/A
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Histogram of students' grades over the years:
Graphic PNG
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XLS
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Course objectives:
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The student will acquire deeper information about principles, experimental and theoretical possibilities of applications of selected analytical methods suitable for the study of thin films.
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Requirements on student
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The exam is written and oral. During semester, the knowledge is checked via two tests. Their results are taken into account for the overall evaluation.
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Content
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UV-VIS spectroscopy. Optical absorption spectra of organic and inorganic compounds. Spectrophotometers - construction and procedures of spectra measurements.
Emission spectroscopy (fluorescence and phosphorescence). Excitation energy transfer. Instruments construction and procedures of measurements.
Optical methods of thin films characterization: optical transmittance and reflectivity, spectroscopic ellipsometry. Profilometry.
Fourier transformation, its basic description and application in infrared spectroscopy. Infrared spectroscopy - principles, spectrophotometers, applications.
Raman spectroscopy. Basic principles. Experimental techniques of Raman spectroscopy.
Theory of nuclear magnetic resonance. Spin behavior in a magnetic field, resonance, nuclear shielding, chemical shift, relaxation. NMR spectrometers and measurements methods. Applications of NMR.
Optothermal experimental methods. Photoacoustics and photoacoustic spectroscopy and microscopy. Applications possibilities to study of thin ink layers.
Electron paramagnetic (spin) resonance. Origin of EPR signal. EPR spectral parameters. EPR spectrometers and applications of EPR for the study of materials properties.
X-ray diffraction. The structure of materials, lattice, crystallographic system and Bravais cells. The origin of X-rays, its monochromatization and detection. Bragg equation.
Mechanical properties. Elastic and plastic deformation. Measurement and evaluation of materials hardness. Strength, yield strength, fatigue strength. Fracture mechanics.
Optical and electron microscopy. Experimental methods and applications. Analysis of chemical composition by EDX. Atomic force microscopy (AFM) - principles and applications.
Thermoanalytical techniques (DSC, DTA, thermal gravimetry). Principles of the methods, instruments. Determination of chemical composition by elemental analysis.
Mass spectrometry. Principles of the method, basic terms. Mass spectrum. Ionization techniques. Mass analyzers. Applications of mass spectrometry.
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Activities
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Fields of study
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Guarantors and lecturers
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-
Guarantors:
prof. Ing. Petr Němec, Ph.D. ,
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Lecturer:
doc. Ing. Marek Bouška, Ph.D. (50%),
prof. Ing. Petr Němec, Ph.D. (50%),
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Seminar lecturer:
doc. Ing. Marek Bouška, Ph.D. (50%),
prof. Ing. Petr Němec, Ph.D. (50%),
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Literature
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Basic:
Elektronická verze přednášek předmětu
(Němec P., Bouška M.)
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Basic:
Vondráček P. a kol. Metody studia a charakterizace struktury polymerů. Praha, 1991. ISBN 80-7080-087-9.
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Recommended:
Pavia D.L. Introduction to Spectroscopy. 2009.
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Recommended:
Leng Y. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. 2013. ISBN 978-3-527-33463-6.
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Recommended:
Campbell D., Pethrick R.A., White J.R. Polymer Characterization: Physical Techniques. 2000.
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Time requirements
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All forms of study
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Activities
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Time requirements for activity [h]
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Kontaktní výuka
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39
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Příprava na dílčí test
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30
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Domácí příprava na výuku
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13
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Příprava na zkoušku
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60
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Total
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142
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Prerequisites - other information about course preconditions |
Good knowledge of the physics and macromolecular chemistry at the university level is required. Student should be able to understand the physical principles of experimental analytical methods for the study of properties of thin films to exploit them in his/her research work, for example in the frame of diploma work project. |
Competences acquired |
The student will get overview of modern experimental analytical methods useful in the study of thin films, including thin films of polymeric materials, and will be able to understand and interpret experimental results acquired by these methods. Acquired knowledge can be utilized for diploma thesis processing. |
Teaching methods |
- Monologic (reading, lecture, briefing)
- Skills training
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Assessment methods |
- Oral examination
- Written examination
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